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PRODUCTS

  • Multi-Pin Support
  • Fine pitch
  • Test Sockets

Semiconductor Component Inspection

HURO’s semiconductor component inspection equipment is a precision inspection system designed to accurately evaluate the electrical characteristics and contact conditions of semiconductor test pins and sockets. Engineered for efficient inspection of a large number of test pins, the system delivers stable and consistent measurement results even in repetitive testing environments. By simplifying the measurement process, it enhances operational efficiency while ensuring high stability and contact reliability—ultimately improving inspection accuracy.

In addition, the software-based control and monitoring environment enables intuitive operation and systematic management of inspection results.

Component Inspection
Technologies
  • · Contact reliability inspection technology for test pins and sockets
  • · Multi-channel measurement–based inspection architecture
  • · Mechanically aligned structure for stable and reliable contact
  • · Simplified mechanical and measurement design
  • · Software-based control and monitoring environment
  • · Efficient management and utilization of measurement data
  • · Scalable compatibility with various pin and socket configurations
Applications
  • · A flexible semiconductor component inspection solution applicable across diverse testing environments, from R&D stages to quality control and process validation

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